International journal of

ADVANCED AND APPLIED SCIENCES

EISSN: 2313-3724, Print ISSN:2313-626X

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 Volume 5, Issue 6 (June 2018), Pages: 70-78

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 Original Research Paper

 Title: Application of silicon micro hall sensors in variable temperature scanning hall probe microscopy (SHPM) using multiple feedback techniques

 Author(s): Rizwan Akram *

 Affiliation(s):

 Faculty of Electrical Engineering, Qassim University, P. O. B. 6677, Buraidah, 51452, Saudi Arabia

 https://doi.org/10.21833/ijaas.2018.06.011

 Full Text - PDF          XML

 Abstract:

A quest for a quantitative and noninvasive method for the measurement of local magnetic fields along with surface morphology with high spatial and field resolution at variable temperatures calls for a selection of suitable magnetic sensor and appropriate scanning system. Scanning Hall probe microscopy (SHPM) is one of the choices as it addresses the stated issues and complements the other magnetic imaging methods. Si-Hall sensors due to their compatibility with CMOS technology and controllability of its parameters makes it preferable compared to other compound semiconductors. However, there have been few reports on magnetic imaging with Si-Hall sensors at high-temperatures and the selection of best possible feedback mechanism for them has not been addressed. In this article, working temperature range and the impediments related to feedback (STM tracking or AFM tracking) configuration for Si-Hall sensors along with feasibility of switchable feedback tracking configuration has been investigated. Si-Hall sensors (~0.7μm × 0.7μm × 510nm) have been fabricated with integrated Gold tip for STM-feedback and were mounted on Quartz Tuning Fork (QTF) for AFM-feedback. Comparison of simultaneous scans of magnetic and topographic data for a Hard disc sample, illustrated that the Si-Hall sensors are capable of scanning with comparable quality of images as with AlGaAs-HP for low temperatures (down to LNT) using STM feedback and as GaN/AlGaN-HP for high temperatures up to 150oC using AFM feedback. Use of QTF with Si-HP provided an option to electronically switch the feedback configuration between STM and AFM without the need to change front end assembly. 

 © 2018 The Authors. Published by IASE.

 This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).

 Keywords: Hall effect devices, Scanning hall probe microscopy, Silicon on insulator, Quartz tuning fork, Atomic force microscopy, Scanning tunneling microscopy

 Article History: Received 30 December 2017, Received in revised form 24 March 2018, Accepted 8 April 2018

 Digital Object Identifier: 

 https://doi.org/10.21833/ijaas.2018.06.011

 Citation:

 Akram R (2018). Application of silicon micro hall sensors in variable temperature scanning hall probe microscopy (SHPM) using multiple feedback techniques. International Journal of Advanced and Applied Sciences, 5(6): 70-78

 Permanent Link:

 http://www.science-gate.com/IJAAS/2018/V5I6/Akram.html

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